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LT3600智能激光粒度儀

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真理光學(xué)儀器有限公司專注于Gao端顆粒表征儀器的研發(fā)和制造,產(chǎn)品涵蓋激光(衍射法)粒度分析儀、動(dòng)態(tài)光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀,既有實(shí)驗(yàn)室儀器,又有在線檢測(cè)系統(tǒng)。真理光學(xué)秉持“科學(xué)態(tài)度,工匠精神”,為用戶提供世界Xian進(jìn)的Gao端產(chǎn)品和服務(wù)。

真理光學(xué)匯集了以張福根博士為代表的全國顆粒表征領(lǐng)域的頂尖人才。張福根博士現(xiàn)任本公司董事長(zhǎng)兼首Xi科學(xué)家,還擔(dān)任全國顆粒表征及分檢與篩網(wǎng)標(biāo)準(zhǔn)化技術(shù)委員會(huì)副主任委員、天津大學(xué)兼職教授,曾擔(dān)任中國顆粒學(xué)會(huì)副理事長(zhǎng),同時(shí)也是“歐美克”字號(hào)公司的創(chuàng)始人。曾擔(dān)任英國某粒度儀器公司中國總經(jīng)理20余年的秦和義先生擔(dān)任本公司商務(wù)總經(jīng)理,中國顆粒學(xué)會(huì)青年理事潘林超博士、陳進(jìn)博士擔(dān)綱公司的研發(fā)主力。

激光(衍射法)粒度儀雖然已得到廣泛應(yīng)用,但它并不Wan美,不論是科學(xué)基礎(chǔ)方面,還是技術(shù)方案方面。真理光學(xué)的團(tuán)隊(duì)針對(duì)當(dāng)前市面上儀器存在的不足,展開了系統(tǒng)的理論研究和技術(shù)創(chuàng)新,發(fā)現(xiàn)了衍射光斑(愛里斑)的反常變化現(xiàn)象(ACAD),解釋了為什么不能測(cè)量3μm左右的聚苯乙烯微球,并給出了反常區(qū)(不能測(cè)量粒徑)的一般公式;研究了衍射儀器的測(cè)量上限和下限;研究了顆粒折射率偏差對(duì)測(cè)量結(jié)果的影響,發(fā)明了兩種根據(jù)散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術(shù)方案(Zhuan利),解決了前向超大角測(cè)量盲區(qū)的問題,使衍射儀器的亞微米顆粒測(cè)量水平顯著提高;提出了統(tǒng)一的反演算法(專有技術(shù)),消除了不同計(jì)算模式給出不同結(jié)果的尷尬;設(shè)計(jì)出了高達(dá)20Kfps的超高速并行數(shù)據(jù)采樣電路,使干法測(cè)量的精度不亞于濕法測(cè)量,對(duì)高速噴霧場(chǎng)的測(cè)量(時(shí)間)分辨率也更高。

在納米粒度及Zeta電位儀方面,真理光學(xué)提出了比相位分析法(PALS)更先進(jìn)的余弦擬合相位分析法(CF-PALS),用光纖分束取代了傳統(tǒng)的平板分束鏡分束,用光纖內(nèi)光干涉取代了自由空間干涉,使Zeta電位的測(cè)量重復(fù)性大幅度提高。

Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.

Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.

Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.

In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.




專注于顆粒(包含粉體顆粒、乳膠顆粒和液體霧滴)測(cè)試技術(shù)的研發(fā)和儀器的生產(chǎn)銷售

  粒度測(cè)試儀是真理光學(xué)技術(shù)團(tuán)隊(duì)基于二十多年粒度表征和應(yīng)用經(jīng)驗(yàn)開發(fā)的新一代粒度分析系統(tǒng),該系統(tǒng)加持多項(xiàng)創(chuàng)新技術(shù)和,測(cè)量速度高達(dá)每秒20000次,而且Hydrolink分散進(jìn)樣器更是采用了雙電機(jī)驅(qū)動(dòng),內(nèi)置高效率超聲,強(qiáng)力攪拌和離心循環(huán)泵分開獨(dú)立控制,適用于各種類型的復(fù)雜樣品,對(duì)于密度大和分布寬的金屬粉末和硬質(zhì)合金等樣品,也能輕松分散和進(jìn)樣并獲得可靠的高重現(xiàn)性結(jié)果。
 
  粒度測(cè)試儀功能說明:
 
  1、功能強(qiáng)大的軟件系統(tǒng)
 
  粒度測(cè)試儀是集光、機(jī)、電、計(jì)算機(jī)為一體的高科技產(chǎn)品,數(shù)據(jù)處理有的計(jì)算機(jī)分析系統(tǒng)軟件完成,同時(shí)由打印機(jī)完成測(cè)試報(bào)告的輸出。
 
  2、*的光路一體化技術(shù)的光學(xué)變換設(shè)計(jì),結(jié)合*的光路一體化結(jié)構(gòu),使光路更加穩(wěn)定;使用,無須調(diào)整。的機(jī)械設(shè)計(jì)與加工工藝,使儀器的結(jié)構(gòu)更緊湊合理,流線型的設(shè)計(jì),美觀大方,使用與維護(hù)更為方便;有效的屏蔽與抗干擾技術(shù)使儀器的電氣等性能更加穩(wěn)定。
 
  3、粒度測(cè)試儀儀*的光電接收器陣列設(shè)計(jì),有效提高了儀器的分辨率。其中,主向光電接收器,共有71個(gè)光電池,大探測(cè)角達(dá)21.5°;非均勻交叉排列的側(cè)向及后向光電接收器,共9個(gè)光電池大后向探測(cè)角度達(dá)135°,使測(cè)試下線到0.04mm。
 
  4、耐用
 
  采用波長(zhǎng)635nm,功率3mw半導(dǎo)全激光器,使用壽命在25000個(gè)小時(shí)以上有效提高了激光粒度分布儀的使用和存放時(shí)間。
 
  5、的H.Golub分布反演算法
 
  粒度測(cè)試儀采用的全Mie散射理論作為基礎(chǔ),并采用優(yōu)良的H.Golub分布反演算法,結(jié)合*的儀器硬件設(shè)計(jì),使您測(cè)試的樣品無論是單分布的,還是混合的,都能夠使測(cè)試數(shù)據(jù)更加、快捷。
 
  粒度測(cè)試儀具有以下優(yōu)勢(shì):
 
  1、符合ISO13320衍射法測(cè)量技術(shù)標(biāo)準(zhǔn);
 
  2、*的光路配置,超大連續(xù)的物理測(cè)量角度,無檢測(cè)盲區(qū);
 
  3、改進(jìn)型反演算法,用戶無需選擇“分析模式”,兼顧的分辨率和穩(wěn)定性;
 
  4、無需更換透鏡,無需使用標(biāo)準(zhǔn)樣校準(zhǔn),量程范圍達(dá)到0.02微米至3600微米;
 
  5、采用全息信號(hào)同步處理技術(shù),實(shí)時(shí)測(cè)量速度高達(dá)每秒20000次,不漏檢任何形狀和分布顆粒的衍射信息;
 
  6、采用自動(dòng)溫度恒定技術(shù)的超高穩(wěn)定固體激光光源系統(tǒng),克服了氦氖氣體激光器預(yù)熱時(shí)間;
 
  7、采用偏振空間濾波技術(shù),摒棄導(dǎo)致機(jī)械和熱穩(wěn)定性差的針孔濾波器;
 
  8、金屬拉絲外殼設(shè)計(jì),兼顧耐用性和提高儀器的抗干擾能力。
 
  粒度測(cè)試儀廠家概述:
 
  珠海真理光學(xué)儀器有限公司專注于顆粒表征和分析儀器的研發(fā)和生產(chǎn),公司聚集了多位在顆粒學(xué)和粉體技術(shù)領(lǐng)域具有豐富經(jīng)驗(yàn)和工作成就的精英人才,其涵蓋顆粒表征技術(shù)的基礎(chǔ)理論研究、應(yīng)用技術(shù)開發(fā)、產(chǎn)品制造、和商業(yè)運(yùn)營服務(wù)。真理光學(xué)秉持以科學(xué)為先導(dǎo),運(yùn)用的技術(shù)手段,通過精細(xì)的管理,為客戶提供的粒度表征及應(yīng)用技術(shù)解決方案,其代表產(chǎn)品LT3600粒度儀適用于藥物的顆粒粒度表征分析。在原料藥的生產(chǎn)中,粒度是其一項(xiàng)*的指標(biāo)。根據(jù)不同的片劑溶出度的要求,原料藥的粒度應(yīng)該控制在不同的粒度段,以達(dá)到藥效理想化。


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