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超高速智能粒度分析儀

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真理光學(xué)儀器有限公司專注于Gao端顆粒表征儀器的研發(fā)和制造,產(chǎn)品涵蓋激光(衍射法)粒度分析儀、動(dòng)態(tài)光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀,既有實(shí)驗(yàn)室儀器,又有在線檢測系統(tǒng)。真理光學(xué)秉持“科學(xué)態(tài)度,工匠精神”,為用戶提供世界Xian進(jìn)的Gao端產(chǎn)品和服務(wù)。

真理光學(xué)匯集了以張福根博士為代表的全國顆粒表征領(lǐng)域的頂尖人才。張福根博士現(xiàn)任本公司董事長兼首Xi科學(xué)家,還擔(dān)任全國顆粒表征及分檢與篩網(wǎng)標(biāo)準(zhǔn)化技術(shù)委員會(huì)副主任委員、天津大學(xué)兼職教授,曾擔(dān)任中國顆粒學(xué)會(huì)副理事長,同時(shí)也是“歐美克”字號(hào)公司的創(chuàng)始人。曾擔(dān)任英國某粒度儀器公司中國總經(jīng)理20余年的秦和義先生擔(dān)任本公司商務(wù)總經(jīng)理,中國顆粒學(xué)會(huì)青年理事潘林超博士、陳進(jìn)博士擔(dān)綱公司的研發(fā)主力。

激光(衍射法)粒度儀雖然已得到廣泛應(yīng)用,但它并不Wan美,不論是科學(xué)基礎(chǔ)方面,還是技術(shù)方案方面。真理光學(xué)的團(tuán)隊(duì)針對當(dāng)前市面上儀器存在的不足,展開了系統(tǒng)的理論研究和技術(shù)創(chuàng)新,發(fā)現(xiàn)了衍射光斑(愛里斑)的反常變化現(xiàn)象(ACAD),解釋了為什么不能測量3μm左右的聚苯乙烯微球,并給出了反常區(qū)(不能測量粒徑)的一般公式;研究了衍射儀器的測量上限和下限;研究了顆粒折射率偏差對測量結(jié)果的影響,發(fā)明了兩種根據(jù)散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術(shù)方案(Zhuan利),解決了前向超大角測量盲區(qū)的問題,使衍射儀器的亞微米顆粒測量水平顯著提高;提出了統(tǒng)一的反演算法(專有技術(shù)),消除了不同計(jì)算模式給出不同結(jié)果的尷尬;設(shè)計(jì)出了高達(dá)20Kfps的超高速并行數(shù)據(jù)采樣電路,使干法測量的精度不亞于濕法測量,對高速噴霧場的測量(時(shí)間)分辨率也更高。

在納米粒度及Zeta電位儀方面,真理光學(xué)提出了比相位分析法(PALS)更先進(jìn)的余弦擬合相位分析法(CF-PALS),用光纖分束取代了傳統(tǒng)的平板分束鏡分束,用光纖內(nèi)光干涉取代了自由空間干涉,使Zeta電位的測量重復(fù)性大幅度提高。

Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.

Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.

Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.

In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.




專注于顆粒(包含粉體顆粒、乳膠顆粒和液體霧滴)測試技術(shù)的研發(fā)和儀器的生產(chǎn)銷售

  超高速智能粒度分析儀是通過顆粒的衍射或散射光的空間分布來分析顆粒大小的儀器,采用Furanhofer衍射及Mie散射理論,測試過程不受溫度變化、介質(zhì)黏度,試樣密度及表面狀態(tài)等諸多因素的影響,只要將待測樣品均勻地展現(xiàn)于激光束中,即可獲得的測試結(jié)果。
  目前超高速智能粒度分析儀測試過程中都面臨一個(gè)遮光度的選擇,通俗來講遮光度就是在使用超高速智能粒度分析儀測試樣品時(shí),配置的樣品懸浮液的濃度,遮光度的正確選擇是超高速智能粒度分析儀在粒度測試過程中的一個(gè)重要的步驟,遮光度是否合適或者說被測樣品的濃度是否合適嚴(yán)重關(guān)系到粒度測量結(jié)果的性和代表性。
  超高速智能粒度分析儀的測量原理要求在測試過程中,樣品的濃度以樣品中顆粒之間相互不發(fā)生二次散射為原則,理論上就是要求懸浮液或者空氣中顆粒之間的距離為顆粒直徑的3倍,但是這個(gè)要求非常難以掌握,因此在實(shí)際的粒度測試中,通過調(diào)整遮光比的數(shù)值來盡量顆粒之間不發(fā)生二次散射。遮光比不宜過大或者過小,遮光比過大時(shí),顆粒的濃度過高,容易發(fā)生二次散射,測量結(jié)果誤差增大;遮光比過低,樣品中顆粒的濃度太低,顆粒數(shù)太少,測試結(jié)果的代表性很差,甚至可能導(dǎo)致測試結(jié)果是無效的,因此在測試過程中,對遮光比的選取要通過反復(fù)試驗(yàn),以得到正確的測量結(jié)果。
  一般來說,對于比較粗的樣品,遮光比可以選擇的比較高,如10~20%,正常情況可以為5~20%;對于超細(xì)的樣品,可以適當(dāng)降低樣品的遮光比,但一般不要超過40%,這些都是實(shí)驗(yàn)得到的經(jīng)驗(yàn)數(shù)值,但還需通過反復(fù)實(shí)驗(yàn),找到對應(yīng)樣品測試時(shí)遮光比的*數(shù)值。


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