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當(dāng)前位置:深圳市深東金儀器有限公司>>探頭/附件>>泰克_示波器探頭>> 美國泰克P6246示波器探頭
參 考 價(jià) | 面議 |
產(chǎn)品型號(hào)
品 牌TeKtronix/美國泰克
廠商性質(zhì)代理商
所 在 地深圳市
更新時(shí)間:2024-06-23 16:52:45瀏覽次數(shù):818次
聯(lián)系我時(shí),請告知來自 化工儀器網(wǎng)泰克無源探頭TPP0051/0100/0101/0201/0200
P5910/5934/5960/6960HS/6982/6860/69
P6246/6247/7504/6248\6330\7506\7330
產(chǎn)地類別 | 國產(chǎn) | 應(yīng)用領(lǐng)域 | 電子,汽車,電氣,綜合 |
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美國泰克P6246示波器探頭的詳細(xì)介紹:
Features & Benefits
P6248
1.7 GHz (Typical Probe Only ≤27 °C) 1X Mode
1.5 GHz Bandwidth (Guaranteed)
1.85 GHz (Typical Probe Only ≤27 °C) 10X Mode
P6247
>1.0 GHz Bandwidth (Guaranteed)
P6246
400 MHz Bandwidth (Guaranteed)
General
Low Input Capacitance:<1 pF Differential
Probe Input Connector: Two Standard 0.025 in./0.63 mm (0.1 in. Center) Square Pin Receptacle (Female)
Electrostatic Discharge Tolerant (IEC 801-2)
Connects to TekProbe® BNC Interface on TDS Series Oscilloscopes or Other Instruments using 1103 TekProbe® Power Supply
For use with Oscilloscopes, Spectrum Analyzers, or Network Analyzers
>60 dB (1000:1) Common Mode Rejection Ratio (CMRR)
Small Probe Head Allows Easy Probing of SMDs
Applications
Communications (Gigabit Ethernet, IEEE-1394, Fibre Channel)
Semiconductor Characterization (RAMBUS)
Disk Drive Read Channel Design
Communication Pulse Shape Compliance
Jitter, Crosstalk, and BERT Measurements
Location of Ground Bounce
The P6246, P6247, and P6248 Differential Probes
The P6248, P6247, and P6246 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in disk drive, digital IC design (RAMBUS), and communication applications (Gigabit Ethernet, IEEE-1394 Firewire, and Fibre Channel). The P6248 includes accessories that allow RAMBUS via probing and IEEE-1394 interconnect access. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface-mount devices while maintaining high CMRR.
The P6246, P6247, and P6248 are ideal for design verification of disk drive read, channel electronics, and timing analysis for troubleshooting ground-bounce problems associated with high-speed logic. They can also be used for pulse shape or crosstalk compliance testing of high-speed communication signals.
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