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介電常數(shù)損耗因數(shù)試驗儀

介電常數(shù)損耗因數(shù)試驗儀
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  • 所在地 北京市

更新時間:2024-08-13 20:19:38瀏覽次數(shù):1330

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產(chǎn)品簡介
介電常數(shù)損耗因數(shù)試驗儀系統(tǒng)由BH916測試裝置(夾具)、GDAT型高頻Q表、數(shù)據(jù)采集和tanδ自動測量控件(裝入GDAT)、及LKI-1型電感器組成,它依據(jù)國標(biāo)GB/T 1409-2006、美標(biāo)ASTM D150以及電工委員會IEC60250的規(guī)定設(shè)計制作。系統(tǒng)提供了絕緣材料的高頻介質(zhì)損耗角正切值(tanδ)和介電常數(shù)(ε)自動測量的Z佳解決方案。

介電常數(shù)損耗因數(shù)測試儀系統(tǒng)由BH916測試裝置(夾具)、GDAT型高頻Q表、數(shù)據(jù)采集和tanδ自動測量控件(裝入GDAT)、及LKI-1型電感器組成,它依據(jù)國標(biāo)GB/T 1409-2006、美標(biāo)ASTM D150以及電工委員會IEC60250的規(guī)定設(shè)計制作。系統(tǒng)提供了絕緣材料的高頻介質(zhì)損耗角正切值(tanδ)和介電常數(shù)(ε)自動測量的*解決方案。

1、《BH916介質(zhì)損耗裝置》(測試夾具)是測試系統(tǒng)的核心檢測部件,它由一個LCD數(shù)字顯示的微測量裝置和一對經(jīng)精密加工的、間距可調(diào)的平板電容器極片組成。平板電容器極片用于夾持被測材料樣品,微測量裝置則顯示被測材料樣品的厚度。通過被測材料樣品放進平板電容器和不放進樣品時的Q值變化的量化,測得絕緣材料的損耗角正切值。從平板電容器平板間距的讀值變化則可換算得到絕緣材料介電常數(shù)。BH916介質(zhì)損耗測試裝置是本公司研制的更新?lián)Q代產(chǎn)品,精密的加工設(shè)計、精確的LCD數(shù)字讀出、一鍵式清零功能,克服了機械刻度讀數(shù)誤差和圓筒形電容裝置不可避免的測量誤差。



BH916測試裝置                                         GDAT高頻Q表


平板電容極片 Φ50mm                                  可選頻率范圍20KHz-60MHz、


間距可調(diào)范圍≥15mm                                   頻率指示誤差3×10-5±1個字


夾具插頭間距25mm±0.01mm                              主電容調(diào)節(jié)范圍30-500


測微桿分辨率0.001mm                                  主調(diào)電容誤差<1%或1pF


夾具損耗角正切值≦4×10-4 (1MHz)                     Q測試范圍2~1023





介電常數(shù)損耗因數(shù)測試儀基于串聯(lián)諧振原理的《GDAT高頻Q表》是測試系統(tǒng)的二次儀表,其數(shù)碼化主調(diào)電容器的創(chuàng)新設(shè)計代表了行業(yè)的zui高成就,隨之帶來了頻率、電容雙掃描GDAT的全新搜索功能。該表具有*人機界面,采用LCD液晶屏顯示各測量因子:Q值、電感L、主調(diào)電容器C、測試頻率F、諧振趨勢指針等。高頻信源采用直接數(shù)字合成,測試頻率10KHz-60MH200KHz-160MHz,頻率精度高達1×10-6。國標(biāo)GB/T 1409-2006規(guī)定了用Q表法來測定電工材料高頻介質(zhì)損耗角正切值(tanδ)和介電常數(shù)(ε),把被測材料作為平板電容的介質(zhì),與輔助電感等構(gòu)成串聯(lián)諧振因子引入Q表的測試回路,以獲取zui高的測試靈敏度。因而Q表法的測試結(jié)果更真實地反映了介質(zhì)在高頻工作狀態(tài)下的特征。

   GDAT高頻Q表的全數(shù)字化界面和微機控制使讀數(shù)清晰穩(wěn)定、操作簡便。操作者能在任意點頻率或電容值的條件下檢測Q值甚至tanδ,無須關(guān)注量程和換算,*摒棄了傳統(tǒng)Q表依賴面板上印制的輔助表格操作的落后狀況,它無疑是電工材料高頻介質(zhì)損耗角正切值(tanδ)和介電常數(shù)(ε)測量的理想工具。



介電常數(shù)損耗因數(shù)測試儀因數(shù)(Q)的電感器是測量系統(tǒng)*的輔助工具,關(guān)乎測試的靈敏度和精度,在系統(tǒng)中它與平板電容(BH916)構(gòu)成了基于串聯(lián)諧振的測試回路。本系統(tǒng)推薦的電感器為LKI-1電感

數(shù)據(jù)采集和tanδ自動測量控件(裝入GDAT),實現(xiàn)了數(shù)據(jù)采集、數(shù)據(jù)分析和計算的微處理化,tanδ 測量結(jié)果的獲得無須繁瑣的人工處理,因而提高了數(shù)據(jù)的精確度和測量的同一性,是人工讀值和人工計算*的。



介電常數(shù)損耗因數(shù)測試儀標(biāo)準(zhǔn)配置:

高配Q表 一只 

試驗電極  一只 (c類)

電感      一套(9只)

電源線    一條

說明書    一份

合格證    一份

保修卡    一份




介電常數(shù)損耗因數(shù)測試儀工作特性

   1.Q值測量

  a.Q值測量范圍:2~1023;

  b.Q值量程分檔:30、100、300、1000、自動換檔或手動換檔;

c.標(biāo)稱誤差


A

C

頻率范圍

25kHz~10MHz

100kHz~10MHz

固有誤差

≤5%±滿度值的2%

≤5%±滿度值的2%

工作誤差

≤7%±滿度值的2%

≤7%±滿度值的2%

頻率范圍

10MHz~60MHz

10MHz~160MHz

固有誤差

≤6%±滿度值的2%

≤6%±滿度值的2%

工作誤差

≤8%±滿度值的2%

≤8%±滿度值的2%

   2.電感測量范圍

A

C

14.5nH~8.14H

4.5nH~140mH

3.電容測量


A

C

直接測量范圍

1~460p

1~205p

主電容調(diào)節(jié)范圍

40~500pF

18~220pF

準(zhǔn)確度

150pF以下±1.5pF;

150pF以上±1%

150pF以下±1.5pF

150pF以上±1%

   注:大于直接測量范圍的電容測量見使用方法。

   4.信號源頻率覆蓋范圍

    

A

C

頻率范圍

10kHz~60MHz

0.1~160MHz

CH1

10~99.9999kHz

0.1~0.999999MHz

CH2

100~999.999kHz

1~9.99999MHz

CH3

1~9.99999MHz

10~99.9999MHz

CH4

10~60MHz

100~160MHz

頻率指示誤差

3×10-5±1個字


  5.Q合格指示預(yù)置功能:預(yù)置范圍:5~1000

   6.Q表正常工作條件

   a. 環(huán)境溫度:0℃~+40℃;

  b.相對濕度:<80%;

  c.電源:220V±22V,50Hz±2.5Hz。

   7.其他

  a.消耗功率:約25W;

   b.凈重:約7kg;

   c.外型尺寸:(寬×高×深)mm:380×132×280。



介電常數(shù)損耗因數(shù)測試儀維修

1.新購儀器的檢查

新購的儀器能先用LKI-1電感組,將各個電感在各個不同頻率測試Q值,把測試的情況,例使用的電感號、測試頻率Q讀數(shù)、電容讀數(shù)等多次測得數(shù)及測試環(huán)境條件逐一詳細(xì)記錄,并把記錄保存起來,以供以后維修時作參考。

LKI-1電感組是測試時作輔助電感用的,不能把這些電感當(dāng)作高精度的標(biāo)準(zhǔn)電感看待。隨著測試環(huán)境條件不同,測得電感器Q值和分布電容可能略有不同。

2.使用和保養(yǎng)

高頻Q表是比較精密的阻抗測量儀器,在合理使用和注意保養(yǎng)情況下,才能保證長期穩(wěn)定和較高的測試精度。

a.熟悉本說明書,正確地使用儀器;

b.使儀器經(jīng)常保持清潔、干燥;

c.本儀器保用期為18個月,如發(fā)現(xiàn)機械故障或失去準(zhǔn)確度,可以原封送回本廠,免費修理。



介電常數(shù)損耗因數(shù)測試儀儀器特點:
☆接線簡單(正接法兩根線,反接可使用一根線),所有電纜線均有接地屏蔽,所以都能拖地使用,測量電壓緩升、緩降,全自動測量,結(jié)果直讀,無須換算。
☆多種測量方式 可選擇正/反接線、內(nèi)/外標(biāo)準(zhǔn)電容器和內(nèi)/外試驗電壓進行測量。正接線可測量高壓介損。
抗震性能 儀器可承受長途運輸中強烈震動顛簸而不會損壞。
抗干擾能力強 采用自動跟蹤干擾抵償電路,將矢量運算法與移相法結(jié)合,有效地消除強電場干擾對測量的影響,適用于500kV及其以下電站的現(xiàn)場試驗。
CVT測量 *自激法測量CVT功能,不需外加任何設(shè)備,可完成不可拆頭CVT的測量。一次接線(三根電纜,不用倒線),一個測量過程(大約1分鐘),兩個zui終測量結(jié)果(C1C2的介損及電容值)。測量過程中文顯示,能實時監(jiān)測自激電流值和試驗電壓(高壓)值。能消除引線對測試的影響,測量結(jié)果準(zhǔn)確可靠。
安全措施(1)高壓保護:試品短路、擊穿或高壓電流波動,能迅速切斷高壓輸出。
2CVT保護:設(shè)定自激電壓的過流點,一旦超出設(shè)置的電流值,儀器自動退出測量,不會損壞設(shè)備。
3)接地檢測:儀器有接地檢測功能,未接地時不能升壓測量。
4)防誤操作:具備防誤操作設(shè)計,能判別常見接線錯誤,安全報警。
5)防“容升":測量大容量試品時會出現(xiàn)電壓抬高的“容升"效應(yīng),儀器能自動跟蹤輸出電壓,保持試驗電壓恒定。
VFD顯示 采用新穎的大屏幕VFD點陣顯示器,在嚴(yán)冬和盛夏都能清晰顯示。全中文操作菜單,操作提示各種警告信息,直觀明了,不需查閱說明書即可操作。
☆打印 儀器附有微型打印機,以中文方式打印輸出測量結(jié)果及狀態(tài)。
RS232 儀器具有RS232接口,與計算機連接便于數(shù)據(jù)的統(tǒng)計和處理及保存。
☆可選購與計算機通信應(yīng)用程序。



介電常數(shù)損耗因數(shù)測試儀電感器:

按測試頻率要求,需要配置不同量的電感器。

例如:在1MHz測試頻率時,要配250μH電感器,在50MHz測試頻率時,要配0.1μH電感器等。


高頻介質(zhì)樣品(選購件):
在現(xiàn)行高頻介質(zhì)材料檢定系統(tǒng)中,檢定部門為高頻介質(zhì)損耗測量儀提供的測量標(biāo)準(zhǔn)是高頻標(biāo)準(zhǔn)介質(zhì)樣品。

該樣品由人工藍(lán)寶石,石英玻璃,氧化鋁陶瓷,聚四氟乙烯,環(huán)氧板等材料做成Φ50mm,厚1~2mm測試樣品。用戶可按需訂購,以保證測試裝置的重復(fù)性和準(zhǔn)確性。


介電常數(shù)損耗因數(shù)測試儀特點: 

◎ 本公司創(chuàng)新的自動Q值保持技術(shù),使測Q分辨率至0.1Q,使tanδ分辨率至0.00005 。

◎ 能對固體絕緣材料在10kHz~120MHz介質(zhì)損耗角(tanδ)和介電常數(shù)(ε)變化的測試。

◎ 調(diào)諧回路殘余電感值低至8nH,保證100MHz的(tanδ)和(ε)的誤差較小。

◎ 特制LCD屏菜單式顯示多參數(shù):Q值,測試頻率,調(diào)諧狀態(tài)等。

◎ Q值量程自動/手動量程控制。

◎ DPLL合成發(fā)生1kHz~60MHz, 50kHz~160MHz測試信號。獨立信號   源輸出口,所以本機又是一臺合成信號源。

◎ 測試裝置符合國標(biāo)GB/T 1409-2006,美標(biāo)ASTM D150以及IEC60250規(guī)范要求。



介電常數(shù)損耗因數(shù)測試儀主要技術(shù)指標(biāo):


2.1 tanδ和ε性能:

2.1.1 固體絕緣材料測試頻率10kHz~120MHz的tanδ和ε變化的測試。

2.1.2 tanδ和ε測量范圍:

tanδ:0.1~0.00005,ε:1~50

2.1.3 tanδ和ε測量精度(1MHz):

tanδ:±5%±0.00005,ε:±2%

工作頻率范圍:50kHz~50MHz    四位數(shù)顯,壓控振蕩器

Q值測量范圍:1~1000三位數(shù)顯,±1Q分辨率

可調(diào)電容范圍:40~500 pF  ΔC±3pF

電容測量誤差:±1%±1pF

Q表殘余電感值:約20nH


Dielectric constant loss factor testing instrument system by BH916 test equipment (fixture), GDAT type high frequency Q table, data acquisition and tan delta automatic measurement control (into GDAT) and LKI-1 type inductor, which according to GB / T 1409-2006, American Standard ASTM D150 and International Electrotechnical Commission IEC60250 provisions of the design. System provides the best solution for automatic measurement of insulation materials, high frequency dielectric loss angle tangent (tan delta) and dielectric permittivity (epsilon).
1, the BH916 dielectric loss device "(test fixture) is the core detection component of the test system. It consists of a LCD digital display micro measuring device and a pair of the precision machining of adjustable spacing plate capacitor pole piece composition. The plate capacitor electrode plate is used for holding the sample of the material sample, and the micro measuring device is shown to thickness of the sample of the material being measured.. Quantitative change through the tested sample material into a parallel plate capacitor and do not put it in the sample when the Q value measured to insulating material loss angle tangent value. From the change of the plate spacing of the plate capacitor, the dielectric constant of the insulating material can be converted.. BH916 dielectric loss test device is the latest development update replacement products, precision machining design, precise LCD digital readout, one click clear function to overcome the mechanical dial reading error and cylindrical capacitor device inevitable measurement errors.
GDAT high frequency Q meter for BH916 test device
Flat sheet capacitor with 50mm optional frequency range 20KHz-60MHz,
Spacing adjustable range of more than 15mm frequency indication error of 3 * 10-5 + 1 words
The main capacitance adjustment range of 30-500 + 0.01mm 25mm for fixture plug distance
Micrometer rod resolution 0.001mm main capacitor error of <1% or 1pF
Clamp the loss tangent value is less than 4 * 10-4 (1MHz) Q test range from 2 to 1023
Dielectric loss factor testing instrument based on series resonance principle in the GDAT high-frequency Q table "is secondary instrument of testing system, the innovative design of the digital tone capacitor on behalf of the industry's highest achievement, resulting in a new search frequency, capacitance double scanning GDAT. The table has advanced man-machine interface, the LCD screen display the measuring factor: Q value, inductance L, tone capacitor C, the test frequency f, resonant trend of pointers. The high frequency source uses direct digital synthesis, the test frequency 200KHz-160MHz or 10KHz-60MH, the frequency accuracy is as high as 1 * 10-6. GB / T 1409-2006 provisions of the Q table method to determination of electrical materials, high frequency dielectric loss angle tangent value (tan delta) and dielectric permittivity (epsilon), the material under test as a flat capacitor medium, and the auxiliary inductor constitutes a series resonant factor is introduced into the Q test loop, in order to obtain the high test sensitivity. Thus, the test results of the Q method are more real, which reflects the characteristics of the medium in high frequency operation state..
The full digital interface and microcomputer control of the high frequency Q GDAT of the high frequency make the reading clear and stable and easy to operate.. The operator can at any point in the frequency or the capacitance value under the condition of Q value and tan delta, no attention span and conversion, and compley abandon the traditional Q table is dependent on the backward state of the auxiliary table operation panel printed, it is undoubtedly the electrical material high frequency dielectric loss angle tangent (Tan delta) and dielectric permittivity (epsilon) measurement of the ideal tool.
Dielectric constant loss factor tester factor (q) of the inductor is a measurement system is indispensable auxiliary tool, relating to the sensitivity and accuracy of the test. In the system it with plate capacitor BH916) constitute the based on series resonant test loop. The inductor of this system is LKI-1 inductor.
Data acquisition and tan delta automatic measurement control (into GDAT) and realizes data acquisition, data analysis and calculation of the micro processing, tan delta measurements obtained without the cumbersome manual processing, thereby enhancing the identity of the data and the precision of the measurement, manual reading value and calculation can not be compared.
Standard configuration of dielectric constant loss factor tester:
A table with Q
Test electrode a (Class C)
Inductance (9 Only)
Power cord one
Manual one
Certificate of conformity
Guarantee card
The working characteristics of dielectric constant loss factor tester
1.Q measurement
A.Q range: 2 ~ 1023;
B.Q range profile: 30, 100, 300, 1000, automatic shift or manual shift;
C. nominal error
A
C
Range of frequency
25kHz ~ 10MHz
100kHz ~ 10MHz
Inherent error
Full scale value is less than or equal to 5% + 2%
Full scale value is less than or equal to 5% + 2%
Working error
Full scale value is less than or equal to 7% + 2%
Full scale value is less than or equal to 7% + 2%
Range of frequency
10MHz ~ 60MHz
10MHz ~ 160MHz
Inherent error
Full scale value is less than or equal to 6% + 2%
Full scale value is less than or equal to 6% + 2%
Working error
Full scale value is less than or equal to 8% + 2%
Full scale value is less than or equal to 8% + 2%
2 inductance measurement range
A
C
14.5nH ~ 8.14H
4.5nH ~ 140mH
3 capacitance measurement
A
C
Direct measurement range
1 ~ 460p
1 ~ 205p
Main capacitance range
40 ~ 500pF
18 ~ 220pF
Accuracy
150pF + 1.5pF;
150pF 1%
150pF + 1.5pF
150pF 1%
Note: the method of measuring the capacitance of the capacitance measuring range is greater than the direct measurement range.
4 signal source frequency coverage
A
C
Range of frequency
10kHz ~ 60MHz
0.1 ~ 160MHz
CH1
10 ~ 99.9999kHz
0.1 ~ 0.999999MHz
CH2
100 ~ 999.999kHz
1 ~ 9.99999MHz
CH3
1 ~ 9.99999MHz
10 ~ 99.9999MHz
CH4
10 ~ 60MHz
100 ~ 160MHz
Frequency indicating error
3 x 10-5 1 words
5.ualified preset function: preset range: 5


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