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當(dāng)前位置:泰州巨納新能源有限公司>>二維材料>>二維材料薄膜>> 機(jī)械剝離單層二硒化鉬薄膜

機(jī)械剝離單層二硒化鉬薄膜

參   考   價(jià): 6371.3

訂  貨  量: ≥1 片

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產(chǎn)品型號(hào)

品       牌2D Semiconductors

廠商性質(zhì)生產(chǎn)商

所  在  地泰州市

更新時(shí)間:2024-06-03 18:46:04瀏覽次數(shù):797次

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Monolayer molybdenum diselenide (1H-MoSe?) flakes have been exfoliated from bulk molybdenum diselenide (2H-MoSe?) onto 90nm thermal oxide and measures from 5micron up to 40micron in size.

Monolayer molybdenum diselenide (1H-MoSe?) flakes have been exfoliated from bulk molybdenum diselenide (2H-MoSe?) onto 90nm thermal oxide and measures from 5micron up to 40micron in size. Each sample contains at least one single-layer MoSe? and is easy to find with the given x and y coordinates. Full characterization is performed on each monolayer flake. Typically, single-layer MoSe? show strong PL at 1.55eV with 0.04 to 0.07eV FWHM, and the Raman peaks are located at 287.5cm-1 (E2g in-plane mode) and 241 cm-1 (A1g out-of-plane mode). All the data is provided with the sample and data includes Raman, photoluminescence, 100x optical images, and x,y coordinates.

Characterization Raman spectroscopy: Raman spectroscopy is data is taken on every single-layer flakes. Typically, flakes show two prominent Raman peaks at 287.5cm-1 (E2g- in plane-) and 241cm-1 (A1g out-of-plane) and the FWHM (full-width-at-half-maximum) is less than 5cm-1.

Photoluminescence (PL): In the single layer form, molybdenum diselenide possesses direct band-gap at 1.55eV. PL measurements show strong PL peak located at 1.56eV with 0.04-0.07 eV PL FWHM.

Optical Microscope images: Each sample is inspected under the optical microscope and x-y coordinates are recorded. Contact us for more information

Possible applications:

Electronics
Sensors - detectors
Optics
STM - AFM applications
Molecular detection - binding
Ultra-low friction studies
Materials science and semiconductor research


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