TAP1500 1.5 GHz有源探頭

TAP1500 1.5 GHz有源探頭Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs.

Key features

• Outstanding electrical performance
  • ≥1.5 GHz probe bandwidth
  • <267 ps rise time
  • ≤1 pF input capacitance
  • 1 M? input resistance
  • -8 V to +8 V input dynamic range
  • -10 V to +10 VDC input offset range
• Versatile mechanical performance
  • Small compact probe head for probing small geometry circuit elements
  • DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
  • Robust design for reliability
• Easy to use
  • Connects directly to oscilloscopes with the TekVPI™ probe interface
  • Provides automatic units scaling and readout on the oscilloscope display
  • Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset
  • Remote GPIB/USB probe control through the oscilloscope
• Applications
  • High-speed Digital Systems Design
  • Component Design and Characterization
  • Manufacturing Engineering and Test
  • Educational Research
  • Signals with Voltage Swings up to 16 V

TAP1500 1.5 GHz有源探頭 active probes for TekVPI™ probe interface

Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP1500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:

• Lower DUT loading effects with ≤1 pF input capacitance and 1 M? input resistance
• Versatile DUT connectivity for attaching to small SMDs
• Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes