High-quality objective allows easy viewing of opaque samples, laser alignment, and can be used as a condenser for brightfield or phase contrast illumination on transparent samples
Powerful real-time and offline rendering options including optical and AFM image overlays
Supports numerous optical techniques such as Brightfield, Phase Contrast, Epifluorescence, Confocal Microscopy, TIRF, FRET, FCS, FRAP, Ion Indicators (e.g. Ca2+ response)
Large Z range (15 µm standard, 40 µm extended Z option) accommodates demanding applications such as cell-cell and cell-substrate adhesion measurements
Choose between open-loop force curves with sensored Z for the ultimate in low noise performance or closed-loop Z for the most accurate velocity control
Force Mapping measures force-distance curves at a grid of points with automated fitting of indentation models for estimation of elastic modulus and automated adhesion/rupture force analysis
多功能性,可滿(mǎn)足多用戶(hù)的不同需求
Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
Unmatched range of nanoelectrical and electromechanical characterization modes
Unique accessories for applying external forces to a wide range of samples