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目錄:賽默飛電子顯微鏡>>透射電子顯微鏡(TEM)>> 最干凈的能譜透射電鏡 Talos F200S TEM

最干凈的能譜透射電鏡 Talos F200S TEM
  • 最干凈的能譜透射電鏡 Talos F200S TEM
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最干凈的能譜透射電鏡 Talos F200S TEM
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最干凈的能譜透射電鏡 Talos F200S TEM

最干凈的能譜透射電鏡 Talos F200S TEM TEM microscope for high productivity, high resolution TEM and STEM characterization with chemical quantification


Talos F200S G2 Transmission Electron Microscope

The Thermo Scientific Talos F200S (S)TEM is a (scanning) transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS). The Talos F200S (S)TEM features great versatility and high through in STEM imaging and allows for precise EDS analysis and high-resolution TEM (HRTEM) for dynamic microscopy.

Talos F200S G2 Transmission Electron Microscope advantages

The Thermo Scientific Talos F200S 200kV (S)TEM combines fast, multichannel, high-resolution (S)TEM imaging and precise compositional analysis to enable dynamic microscopy applications. With innovative features designed to increase throughput, precision, and ease of use, the Talos (S)TEM is ideal for advanced research and analysis across academic, government, and industrial research environments.

Talos F200S G2 Transmission Electron Microscope features

 Intuitive software

Features Thermo Scientific Velox Software for fast and easy acquisition and analysis of multimodal data.

Upgrade

Can be field upgraded to the Thermo Scientific Talos F200X (S)TEM.

Precise chemical composition data

Rapid, precise, quantitative EDS analysis using two in-column Thermo Scientific SDD Super-X Detectors with unique cleanliness, revealing nanoscale details.

Increased stability

Reduced environmental sensitivity thanks to the instrument enclosure, which moderates the impact of air pressure waves, air flows, and fine temperature variations in the TEM room.

Better image data

High-throughput (S)TEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images.

Space for more

Add application-specific in situ sample holders for dynamic experiments.

Specifications

HRTEM line resolution
  • 0.10

HRSTEM [nm]
  • 0.16

Total beam current FEG
  • >150 nA

EDS system
  • 2 SDD windowless design, shutter-protected

EDS energy resolution
  • ≤136 eV for Mn-Kα and 10 kcps (output)

Fast EDS mapping
  • Pixel dwell times down to 10 μs

EDS Net solid angle
  • 0.45 sr


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