官方微信|手機(jī)版

產(chǎn)品展廳

產(chǎn)品求購(gòu)企業(yè)資訊會(huì)展

發(fā)布詢價(jià)單

化工儀器網(wǎng)>產(chǎn)品展廳>光學(xué)儀器及設(shè)備>電子顯微鏡>透射電子顯微鏡(透射電鏡/TEM)> 200KV透射電鏡Spectra 200 TEM

分享
舉報(bào) 評(píng)價(jià)

200KV透射電鏡Spectra 200 TEM

具體成交價(jià)以合同協(xié)議為準(zhǔn)
  • 公司名稱 賽默飛電子顯微鏡
  • 品牌 FEI/賽默飛
  • 型號(hào)
  • 產(chǎn)地
  • 廠商性質(zhì) 生產(chǎn)廠家
  • 更新時(shí)間 2024/8/28 13:41:37
  • 訪問次數(shù) 565
產(chǎn)品標(biāo)簽

TEM透射電鏡Spectra 200 TEM200KV

聯(lián)系方式：張怡玲查看聯(lián)系方式

聯(lián)系我們時(shí)請(qǐng)說明是化工儀器網(wǎng)上看到的信息，謝謝!


原FEI公司，2016年被賽默飛世爾科技收購(gòu)，成為賽默飛材料與結(jié)構(gòu)分析（MSD) 電鏡事業(yè)部，是顯微鏡和微量分析解決方案的創(chuàng)新者和供應(yīng)商。 我們提供掃描電子顯微鏡SEM，透射電子顯微鏡TEM和雙束-掃描電子顯微鏡DualBeam FIB-SEM，結(jié)合先進(jìn)的軟件套件，運(yùn)用廣泛的樣本類型，通過將高分辨率成像與物理、元素、化學(xué)和電學(xué)分析相結(jié)合，使客戶的問題變成有效可用的數(shù)據(jù)。

掃描電子顯微鏡，雙束電鏡，透射電子顯微鏡，冷凍電鏡，X射線光電子能譜儀，三維可視化軟件

價(jià)格區(qū)間 面議 儀器種類 熱場(chǎng)發(fā)射
應(yīng)用領(lǐng)域 環(huán)保,化工

200KV透射電鏡Spectra 200 TEM

200KV透射電鏡Spectra 200 TEM High throughput TEM and STEM microscope for all materials science applications

Key Features


 Powered by the ultra-high-brightness cold field emission gun (X-CFEG)
 High-resolution STEM imaging performance for all accelerating voltages

High-angle annular dark-field (HAADF) images of GaN and silicon.

 Unprecedented sensitivity with the Panther STEM detection system
 Advanced STEM imaging capabilities


Electron microscope pixel array detector (EMPAD) image of MoS2.


 New possibilities in STEM analytics with Spectra 200 S/TEM

Specifications

Spectra 200 (S)TEM

  • Probe corrector:

    • Energy spread: 0.4 eV

    • Information limit: 110 pm

    • STEM resolution: 60 pm (136 pm @ 30 kV)

  • Uncorrected:

    • Energy spread: 0.4 eV

    • Information limit: 110 pm

    • STEM resolution: 164 pm

Source

  • X-CFEG: Ultra-high-brightness cold field emission gun with energy resolution of <0.4 eV

  • Flexible high-tension range from 30 – 200 kV

Analytics and detectors

  • Super-X/Dual-X EDS options, integrated software, and the Gatan Ultrafast EELS/DualEELS options together provide up to 1000 sp/s of simultaneous EDS and EELS data acquisition

  • Analytics for live peak identification and background fitting during ultra-fast EDS acquisition

  • Symmetric EDS detector design allows for combined tomographic EDS

Available detector options

  • HAADF detector

  • On-axis solid state, 8 segmented BF and ADF detectors (16 segments in total)

  • Thermo Scientific Ceta 16M Camera (optionally with speed enhancement)

  • Gatan OneView/OneView IS cameras

  • Gatan energy filter series

  • Electron microscope pixel array detector (EMPAD)





化工儀器網(wǎng)

采購(gòu)商登錄
記住賬號(hào)    找回密碼
沒有賬號(hào)？免費(fèi)注冊(cè)

提示

×

*您想獲取產(chǎn)品的資料：

以上可多選，勾選其他，可自行輸入要求

個(gè)人信息：